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Grzegorz Wielgoszewski

  • PhD
  • R&D Engineer
  • Nanometrologia
  • 6h-indexImpact measure calculated using publication and citation counts. Updated daily.
  • 97CitationsNumber of citations received by Grzegorz's publications. Updated daily.

Research interests

Scanning probe microscopy

Groups

Co-authors (51)

Publications (5)

  • A low-noise measurement system for scanning thermal microscopy resistive nanoprobes based on a transformer ratio-arm bridge

    • Świątkowski M
    • Wojtuś A
    • Wielgoszewski G
    • et al.
    N/AReaders
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  • A symmetrical stretching stage for electrical atomic force microscopy

    • Wielgoszewski G
    • Moczała M
    • Orłowska K
    • et al.
    N/AReaders
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  • Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy

    • Wielgoszewski G
    • Pałetko P
    • Tomaszewski D
    • et al.
    N/AReaders
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  • Scanning probe microscopy investigations of the electrical properties of chemical vapor deposited graphene grown on a 6H-SiC substrate

    • Gajewski K
    • Kopiec D
    • Moczała M
    • et al.
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    N/ACitations
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  • Scanning Thermal Microscopy (SThM): How to Map Temperature and Thermal Properties at the Nanoscale

    • Wielgoszewski G
    • Gotszalk T
    N/AReaders
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Professional experience

R&D Engineer

Nanometrologia

May 2016 - Present

Research Scientist

School Of Physics, University College Dublin

August 2014 - February 2016(2 years)

Education

PhD

Politechnika Wrocławska - Wrocław University of Technology

October 2008 - July 2014(6 years)

Master of Science

Politechnika Wrocławska - Wroclaw University of Technology

October 2003 - July 2008(5 years)