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JinSeok Ko

  • CEO
  • MicroVision Co., Ltd.
  • 1h-indexImpact measure calculated using publication and citation counts. Updated daily.
  • 10CitationsNumber of citations received by JinSeok's publications. Updated daily.

Recent publications

  • Defect detection of polycrystalline solar wafers using local binary mean

    • Ko J
    • Rheem J
    N/AReaders
    10Citations
  • Anisotropic diffusion based micro-crack inspection in polycrystalline solar wafers

    • Ko J
    • Rheem J
    N/AReaders
    0Citations

Professional experience

CEO

MicroVision Co., Ltd.

July 2014 - Present

Education

Ph.D.

Korea University of Technology and Education

September 2009 - February 2014(4 years)

M.S.

Korea University of Technology and Education

March 2004 - February 2006(2 years)

B.S.

Korea University of Technology and Education

March 2000 - February 2004(4 years)

Co-authors (1)

Other IDs