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Nobuhisa Tanuma

  • Dr.
  • Technical Staff
  • Meisei University
  • 4h-indexImpact measure calculated using publication and citation counts. Updated daily.
  • 33CitationsNumber of citations received by Nobuhisa's publications. Updated daily.

Recent publications

  • Hooge parameter of Ge grown for high-μ substrates of future sub-nm FETs

    • Ohya H
    • Toyoshima J
    • Tanuma N
    • et al.
  • Leakage current, noise and reliability of high voltage MLCCs

    • Tacano M
    • Ohya H
    • Morohoshi Y
    • et al.

Professional experience

Technical Staff

Meisei University

April 1998 - Present

Co-authors (22)

Other IDs