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Patrick McNally

  • PhD
  • Professor of Electronic Engineering
  • Dublin City University
  • 14h-indexImpact measure calculated using publication and citation counts. Updated daily.
  • 1062CitationsNumber of citations received by Patrick's publications. Updated daily.

Other IDs

Research interests

synchrotron x-ray topography); copper halide based photonics.Photoacoustic microscopy; x-ray diffraction imaging; nanomaterials and electronic device process characterisation (micro-Raman and photoacoustic spectroscopy

About

Prof. Patrick McNally, BE, ScM, PhD, CEng, CPhys, MIEI, FInstP, SMIEEE, received the BE (First Class Hons.) from University College, Galway, Ireland, and the degrees of ScM and PhD from Brown University, Rhode Island, USA in 1988 and 1992, respectively. In 2006 he was appointed Professor (Personal Chair) in the School of Electronic Engineering at Dublin City University (DCU), Ireland, and was Head of teh School of Electronic Engineering (2012-2015), Director of the Research Institute for Networks & Communications Engineering at DCU (2002-2004). He now directs RINCE’s Nanomaterials Processing Laboratories. He is a member of the following: Institute of Engineers of Ireland (Fellow), Institute of Physics (Fellow), I.E.E.E. (Senior Member). He is a Associate Editor for Journal of Materials Science: Materials in Electronics and has authored or co-authored more than 300 scientific papers. He is founder and a Director of Sonex Metrology Ltd. (www.sonex-metrology.com), an OEM developer of the world's first photoacoustics-based full wafer diameter defect metrology tools. He was CTO 2011-2014 and is now their Chief Scientific Advisor. He led the development of Ireland’s first Postgraduate Taught Masters course in Nanotechnology, which was launched in Sept. 2005 and continues to run successfully to this day.

Co-authors (309)

Publications (5)

  • Highly enhanced UV responsive conductivity and blue emission in transparent CuBr films: Implication for emitter and dosimeter applications

    • Vijayaraghavan R
    • Chandran D
    • Vijayaraghavan R
    • et al.
    N/AReaders
    0Citations
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  • Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages

    • Tanner B
    • Danilewsky A
    • Vijayaraghavan R
    • et al.
    N/AReaders
    1Citations
    Get full text
  • Nondestructive, in Situ Mapping of Die Surface Displacements in Encapsulated IC Chip Packages Using X-Ray Diffraction Imaging Techniques

    • Gorji N
    • Tanner B
    • Vijayaraghavan R
    • et al.
    N/AReaders
    0Citations
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  • Quantitative imaging of the stress/strain fields and generation of macroscopic cracks from indents in silicon

    • Tanner B
    • Allen D
    • Wittge J
    • et al.
    N/AReaders
    0Citations
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  • Remote sensing of a low pressure plasma in the radio near field

    • Kelly S
    • McNally P
    N/AReaders
    0Citations
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Professional experience

Professor of Electronic Engineering

Dublin City University

Education

ScM

Brown University

PhD

Brown University

BE

University College Galway