synchrotron x-ray topography); copper halide based photonics.Photoacoustic microscopy; x-ray diffraction imaging; nanomaterials and electronic device process characterisation (micro-Raman and photoacoustic spectroscopy
Prof. Patrick McNally, BE, ScM, PhD, CEng, CPhys, MIEI, FInstP, SMIEEE, received the BE (First Class Hons.) from University College, Galway, Ireland, and the degrees of ScM and PhD from Brown University, Rhode Island, USA in 1988 and 1992, respectively. In 2006 he was appointed Professor (Personal Chair) in the School of Electronic Engineering at Dublin City University (DCU), Ireland, and was Head of teh School of Electronic Engineering (2012-2015), Director of the Research Institute for Networks & Communications Engineering at DCU (2002-2004). He now directs RINCE’s Nanomaterials Processing Laboratories.
He is a member of the following: Institute of Engineers of Ireland (Fellow), Institute of Physics (Fellow), I.E.E.E. (Senior Member). He is a Associate Editor for Journal of Materials Science: Materials in Electronics and has authored or co-authored more than 300 scientific papers.
He is founder and a Director of Sonex Metrology Ltd. (www.sonex-metrology.com), an OEM developer of the world's first photoacoustics-based full wafer diameter defect metrology tools. He was CTO 2011-2014 and is now their Chief Scientific Advisor.
He led the development of Ireland’s first Postgraduate Taught Masters course in Nanotechnology, which was launched in Sept. 2005 and continues to run successfully to this day.