Serge Bernard received the MS degree in Electrical Engineering from the University of Paris XI, France in 1998 and the PhD degree in Electrical Engineering from the University of Montpellier, France in 2001. He is a researcher of the National Council of Scientific Research (CNRS) in the Microelectronics Department of the Laboratory of Computer Science, Robotics and Microelectronics of Montpellier (LIRMM). He is the co-director of the joint Institute for System Testing ISyTest between the LIRMM and NXP semiconductors. He is the deputy head of the microelectronics department of LIRMM. His main research interests include Test, Design-For-Testability and Built-In-Self-Test for mixed-signal circuits and SiP and Design-For-Reliability for medical application ICs.