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Yoichi Miyahara

  • PhD
  • Research Associate
  • Department of Physics, McGill University
  • 14h-indexImpact measure calculated using publication and citation counts. Updated daily.
  • 692CitationsNumber of citations received by Yoichi's publications. Updated daily.

Research interests

Scanning probe microscopyNanoelectronics

Co-authors (96)

Publications (5)

  • Dissipation modulated Kelvin probe force microscopy method

    • Miyahara Y
    • Grutter P
    N/AReaders
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  • Measuring Spatially Resolved Collective Ionic Transport on Lithium Battery Cathodes Using Atomic Force Microscopy

    • Mascaro A
    • Wang Z
    • Hovington P
    • et al.
    N/AReaders
    N/ACitations
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  • Methods and systems for optimizing frequency modulation atomic force microscopy

    • Labuda A
    • Grutter P
    • Miyahara Y
    • et al.
    N/AReaders
    N/ACitations
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  • Room-Temperature Single-Electron Charging Detected by Electrostatic Force Microscopy

    • Tekiel A
    • Miyahara Y
    • Topple J
    • et al.
    N/AReaders
    N/ACitations
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  • Tunneling Study of the Valence Band Structure of Pb$_{1-x}$Eu$_x$Te

    • Syoji T
    • Miyahara Y
    • Ozaki H
    N/AReaders
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Professional experience

Research Associate

Department of Physics, McGill University

June 2002 - Present

Course Lecturer

McGill University

January 2011 - August 2013(3 years)

Research Associate

Ecole Polytechnique Fedérale de Lausanne

June 1997 - May 2002(5 years)

Education history

Ph D

Waseda University

April 1993 - March 1997(4 years)