A 45nm 0.6V cross-point 8T SRAM with negative biased read/write assist

71Citations
Citations of this article
21Readers
Mendeley users who have this article in their library.

Abstract

We propose a new design solution for embedded SRAM macros with cross point 8T-SRAM for low operating voltage and power. A negative bias technique for VSS and bitline (BL) enables us to achieve not only low power and high access speed, but also the large cell stability and write ability. Using 45-nm CMOS technology, we fabricated the SRAM macro based on our proposal and confirmed that the 1Mbit-SRAM successfully operated at 0.6V. The active power is reduced by 66%, compared to the conventional 6T-SRAM.

Cite

CITATION STYLE

APA

Yabuuchi, M., Nii, K., Tsukamoto, Y., Ohbayashi, S., Nakase, Y., & Shinohara, H. (2009). A 45nm 0.6V cross-point 8T SRAM with negative biased read/write assist. In IEEE Symposium on VLSI Circuits, Digest of Technical Papers (pp. 158–159).

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free