The method of elastic recoil detection, using 1.5-2.2 MeV energy4He beams, has been used for the first time to detect tritium. Test samples were fabricated by thermal sorption of tritium into thin (5 μg cm-2) Ti films and by implantation of low energy (10 keV) HT+ions into amorphized silicon and oxide targets. Distributions of surface and subsurface tritium has been profiled to a depth of a few tenths of a micron, with a depth resolution of 10 to 20 nm and a sensitivity better than 1015atoms cm-1. © 1986.
Mendeley saves you time finding and organizing research
Choose a citation style from the tabs below