Analysis of near-surface tritium in materials by elastic recoil detection under MeV energy helium bombardment

  • Sawicki J
  • Plattner H
  • Mitchell I
 et al. 
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Abstract

The method of elastic recoil detection, using 1.5-2.2 MeV energy4He beams, has been used for the first time to detect tritium. Test samples were fabricated by thermal sorption of tritium into thin (5 μg cm-2) Ti films and by implantation of low energy (10 keV) HT+ions into amorphized silicon and oxide targets. Distributions of surface and subsurface tritium has been profiled to a depth of a few tenths of a micron, with a depth resolution of 10 to 20 nm and a sensitivity better than 1015atoms cm-1. © 1986.

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Authors

  • J. A. Sawicki

  • H. H. Plattner

  • I. V. Mitchell

  • J. Gallant

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