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Journal article

Anodic corrosion of indium tin oxide films induced by the electrochemical oxidation of chlorides

Folcher G, Cachet H, Froment M, Bruneaux J ...see all

Thin Solid Films, vol. 301, issue 1-2 (1997) pp. 242-248

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Abstract

Conducting tin-doped indium oxide (ITO) films were prepared by spray
pyrolysis for study of their electrochemical stability as anodes
in chloride solutions. From reflection high energy electron diffraction
and transmission electron microscopy observations, ITO films present
a regular polycrystalline structure with a very low density of twins.
Corrosion was investigated by in situ mass measurements with a quartz
crystal microbalance (QCM) and by direct imaging of corrosion morphology
with scanning (SEM) and transmission (TEM) electron microscopy. Corrosion
was found to occur at potentials positive of chloride oxidation (0.9
V vs. saturated calomel electrode (SCE)) as long as oxygen is not
evolved (Vpresence of 0.04 M HCl at pH 8 (≤5 ng s−1 cm−2), and very large
in acidic HCl solutions (3400 ng s−1 cm−2 in 0.1 M HCl). TEM
images of corroded ITO membranes reveal an important intergranular
attack. The corrosion mechanism is based on the electrochemical formation
of Cl° and OH° radical species able to withdraw electrons from
In-O surface bonds.

Author-supplied keywords

  • corrosion
  • electrochemistry
  • halogens
  • indium oxide

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Authors

  • G. Folcher

  • H. Cachet

  • M. Froment

  • J. Bruneaux

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