Image acquisition devices which can get infrared image of solar modules is designed by using the principles of the semiconductor's electroluminescence, andimage processing is applied to the detection system which can detect the defects automatically including black pieces, fragmentation, broken grid, crack and so on. At first the defects of the infrared image are classified and then the defects' types and locations are marked out after filtering, single-chip division, gray-scale transformation, binary, feature description and extraction, finally the results are feeded back to the database. This method increases the defects' types (such as invisible crack) which the manual testing is difficult to identify, it also can eliminate human errors which manual testing may produce possibly and can reduce labor costs, defects' rates, futher it can improve the detection's efficiency and productivity of production line. © 2010 IEEE.
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