Automatic detection of defects in solar modules: Image processing in detecting

  • Nian B
  • Fu Z
  • Wang L
 et al. 
  • 1


    Mendeley users who have this article in their library.
  • N/A


    Citations of this article.


Image acquisition devices which can get infrared image of solar modules is designed by using the principles of the semiconductor's electroluminescence, andimage processing is applied to the detection system which can detect the defects automatically including black pieces, fragmentation, broken grid, crack and so on. At first the defects of the infrared image are classified and then the defects' types and locations are marked out after filtering, single-chip division, gray-scale transformation, binary, feature description and extraction, finally the results are feeded back to the database. This method increases the defects' types (such as invisible crack) which the manual testing is difficult to identify, it also can eliminate human errors which manual testing may produce possibly and can reduce labor costs, defects' rates, futher it can improve the detection's efficiency and productivity of production line. © 2010 IEEE.

Get free article suggestions today

Mendeley saves you time finding and organizing research

Sign up here
Already have an account ?Sign in

Find this document


  • B.a b Nian

  • Z.c Fu

  • L.a Wang

  • X.a Cao

Cite this document

Choose a citation style from the tabs below

Save time finding and organizing research with Mendeley

Sign up for free