The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350-1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment. © 2008 American Chemical Society.
CITATION STYLE
Jung, I., Vaupel, M., Pelton, M., Pinery, R., Dikin, D. A., Stankovich, S., … Ruoff, R. S. (2008). Characterization of thermally reduced graphene oxide by imaging ellipsometry. Journal of Physical Chemistry C, 112(23), 8499–8506. https://doi.org/10.1021/jp802173m
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