Characterization of thermally reduced graphene oxide by imaging ellipsometry

  • Jung I
  • Vaupel M
  • Pelton M
 et al. 
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The dispersion functions for the refractive index and the extinction coefficient of single- and multiple-layer graphene oxide samples were measured by imaging spectroscopic ellipsometry in the wavelength range of 350−1000 nm and were compared to previously reported results measured by confocal microscopy. The dispersion functions for thin platelets were also compared to those obtained by standard spectroscopic ellipsometry on a deposit consisting of many overlapping graphene oxide layers. Changes were observed in both the thickness of the deposits and the values of the dispersion parameters following heating. A model is proposed to explain these observations, based on the removal of water between the graphene-oxide layers upon thermal treatment.

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  • Dmitriy DikinTemple University, Philadelphia, PA

  • Inhwa Jung

  • Matthias Vaupel

  • Matthew Pelton

  • Richard Pinery

  • Sasha Stankovich

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