Chemical mapping using reflection terahertz pulsed imaging

  • Shen Y
  • Taday P
  • Newnham D
 et al. 
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Abstract

We report the use of a terahertz pulsed imaging technique for three-dimensional chemical mapping. Terahertzradiation reflected from a sample was measured pixel-by-pixel in time domain using a terahertz pulsed imaging systemdeveloped at TeraView Ltd, UK. The recorded terahertz waveforms were then transformed into frequency domain usingtime-partitioned Fourier transform. Structural maps of samples were obtained by analyzing the terahertz time-domaindata whilst chemical maps were obtained from terahertz spectral data sets. For a sample comprising chemical A at thesurface of a polyethylene pellet and chemical B buried inside the pellet, we have separated the component spatialpatterns of the two chemicals using their spectral fingerprints. The reconstructed three-dimensional chemical maps notonly locate the chemicals in the object, but also identify each chemical. We also demonstrate the capabilities of terahertzpulsed imaging for non-destructive analysis of coating thickness and quality, and for detecting and identifying explosivematerials such as RDX.

Author-supplied keywords

  • Chemical mapping
  • Coating
  • Coating thickness
  • Imaging
  • Pharmaceutical
  • Terahertz
  • Terahertz pulsed imaging
  • analysis
  • security screening
  • spectroscopic imaging
  • teraview
  • three-dimensional

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Authors

  • Y.C. Shen

  • P.F. Taday

  • D.A. Newnham

  • M. Pepper

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