Counterfeit integrated circuits: A rising threat in the global semiconductor supply chain

  • Guin U
  • Huang K
  • Dimase D
 et al. 
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Abstract

The counterfeiting of electronic components has become a major challenge in the 21st century. The electronic component supply chain has been greatly affected by widespread counterfeit incidents. A specialized service of testing, detection, and avoidance must be created to tackle the worldwide outbreak of counterfeit integrated circuits (ICs). So far, there are standards and programs in place for outlining the testing, documenting, and reporting procedures. However, there is not yet enough research addressing the detection and avoidance of such counterfeit parts. In this paper we will present, in detail, all types of counterfeits, the defects present in them, and their detection methods. We will then describe the challenges to implementing these test methods and to their effectiveness. We will present several anti-counterfeit measures to prevent this widespread counterfeiting, and we also consider the effectiveness and limitations of these anti-counterfeiting techniques.

Author-supplied keywords

  • AC/DC parametric tests
  • counterfeit integrated circuits (ICs)
  • electrical inspection
  • hardware security
  • machine learning
  • path-delay test
  • yiorgos.makris@utdallas.edu

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Authors

  • Ke Huang

  • Daniel Dimase

  • John M. Carulli

  • Mohammad Tehranipoor

  • Yiorgos Makris

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