Abstract
A SAR ADC is designed to operate from room temperature down to 4.2K, as needed by cryogenic sensor systems. The ADC is robust to cryogenic temperature-induced transistor anomalies. It has an INL of -0.8(0.5)LSB and DNL of 1.1 (0.4)LSB at 4.2K(300K). It draws 70μA for a 200pF output capacitor at 3kHz sampling rate and 5V supply. ©2007 IEEE.
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CITATION STYLE
APA
Cretan, Y., Merken, P., Sansen, W., Mertens, R., & Van Hoof, C. (2007). A cryogenic ADC operating down to 4.2K. In Digest of Technical Papers - IEEE International Solid-State Circuits Conference (pp. 468–470). Institute of Electrical and Electronics Engineers Inc. https://doi.org/10.1109/ISSCC.2007.373497
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