Electrical Modeling of Thin-Film Transistors

  • Hong D
  • Yerubandi G
  • Chiang H
 et al. 
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Author-supplied keywords

  • 3-layer model
  • channel
  • comprehensive
  • conductance integral equation
  • depletion-mode model
  • device modeling
  • discrete trap model
  • fringing current artifacts
  • mobility
  • series resistance
  • square-law model
  • thin-film transistor
  • trapping

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Authors

  • D Hong

  • G Yerubandi

  • H Q Chiang

  • M C Spiegelberg

  • J F Wager

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