Femtosecond electron diffraction for direct measurement of ultrafast atomic motions

  • Cao J
  • Hao Z
  • Park H
 et al. 
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Abstract

We have developed a femtosecond electron diffraction system capable of directly measuring the complete transient structures with atomic level detail and on 400-fs time scale in solid materials. Additionally, a diffraction image with significant signal-to-noise ratio to reveal the long-range order can be obtained with a single electron pulse of 700 fs in duration. A direct observation of ultrafast lattice expansion following the irradiation of femtosecond pulsed laser of Ag film has been demonstrated. 2003 American Institute of Physics.

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Authors

  • J. Cao

  • Z. Hao

  • H. Park

  • C. Tao

  • D. Kau

  • L. Blaszczyk

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