Femtosecond electron diffraction for direct measurement of ultrafast atomic motions

Abstract

A femtosecond electron diffraction (FED) system was developed for direct measurement of ultrafast atomic motions in solid materials. The FED was operated at kHz repetition rate and in non-space-charge limited regime with 2000 or fewer electrons per pulse. The diffraction images at each delay time were integrated over time for an optimal signal-to-noise ratio for the determination of transient structures.