Field emission from atomically thin edges of reduced graphene oxide

  • Yamaguchi H
  • Murakami K
  • Eda G
 et al. 
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The electron emission properties of thin edges of reduced graphene oxide (rGO) were investigated by field emission microscopy (FEM) and in-situ field ion microscopy (FIM). The electron emission patterns of thin rGO edge consisted of alternating bright and dark fringe bands in the FEM image. The FIM image showed the array of bright spots along the FEM patterns. These results suggested that the field emission occurs at the atomically thin edges of rGO.

Author-supplied keywords

  • atomically thin edge
  • chemically derived grapheme
  • field electron emission
  • field emission pattern
  • interference
  • low threshold field
  • reduced graphene oxide

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  • Hisato Yamaguchi

  • Katsuhisa Murakami

  • Goki Eda

  • Takeshi Fujita

  • Pengfei Guan

  • Weichao Wang

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