It is demonstrated that ultrahigh-resolution angular measurement can be achieved via surface-plasmon-resonance excitation in which the phase difference between p- and s-polarized reflected waves is monitored as a function of the incidence angle. Resolutions down to 1.9 ? 10-6 deg are obtained by performing the measurements at optimal incident wavelengths. This represents an order of magnitude improvement compared with previously reported values. ? 2005 Optical Society of America.
CITATION STYLE
Chiang, H.-P., Lin, J.-L., Chang, R., Su, S.-Y., & Leung, P. T. (2005). High-resolution angular measurement using surface-plasmon-resonance via phase interrogation at optimal incident wavelengths. Optics Letters, 30(20), 2727. https://doi.org/10.1364/ol.30.002727
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