Extended x-ray absorption fine-structure (EXAFS) data collected in the fluorescence mode are susceptible to an apparent amplitude reduction due to the self-absorption of the fluorescing photon by the sample before it reaches a detector. Previous treatments have made the simplifying assumption that the effect of the EXAFS on the correction term is negligible, and that the samples are in the thick limit. We present a nearly exact treatment that can be applied for any sample thickness or concentration, and retains the EXAFS oscillations in the correction term. © Physica Scripta 2005.
CITATION STYLE
Booth, C. H., & Bridges, F. (2005). Improved self-absorption correction for fluorescence measurements of extended x-ray absorption fine-structure. Physica Scripta T, T115, 202–204. https://doi.org/10.1238/Physica.Topical.115a00202
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