Magnetic nanowire arrays in anodic alumina membranes: Rutherford backscattering characterization

  • Hernández-Vélez M
  • Pirota K
  • Pászti F
 et al. 
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Systematic study of magnetic nanowire arrays grown in anodic alumina
membranes (AAM) has been done by means of Rutherford backscattering
spectroscopy (RBS). The AAM used as templates were morphologically
characterized by using high resolution scanning electron microscopy
(HRSEM), fast Fourier transform (FFT) and atomic force microscopy
(AFM). The highly ordered templates with a mean pore diameter size
of 30 nanometers, a mean inter-pore spacing of 100 nm and lengths
ranging from 4 to 180 microns were obtained through two-steps anodization
process, and the Ni and Co nanowire arrays were grown by electrodeposition
techniques. The main attention is addressed to Ni nanowire arrays.
RBS results allowed us to determine the real depth profile of atomic
composition of the obtained nanowire arrays. In addition, the RBS
spectra fitting showed that the porosity increased from the top to
the bottom of the samples. Two phenomenological models are proposed
to understand the apparition of that secondary porosity and a linear
relation between the total amount of electrodeposited Ni and the
electrodeposition time was obtained. As an example, it is also reported
the relation between RBS results and magnetic properties, such as
coercive field and remanence/saturation magnetization ratio of the
samples. Particularly, for Ni nanowires arrays obtained by using
voltage pulses, it is demonstrated that the larger the nanowires,
the higher the definition for easy axis parallel to the nanowire
length is possible.

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