Minimizing Production Test Time to Detect Faults in Analog Circuits

  • Milor L
  • Sangiovanni-Vincentelli A
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Analog testing is a difficult task without a clearcut methodology.
Analog circuits are tested for satisfying their specifications, not for
faults. Given the high cost of testing analog specifications, it is
proposed that tests for analog circuits should be designed to detect
faults. Therefore analog fault modeling is discussed. Based on an
analysis of the types of tests needed for different types of faults,
algorithms for fault-driven test set selection are presented. A major
reduction in testing time should come from reducing the number of
specification tests that need to be performed. Hence algorithms are
presented for minimizing specification testing time. After specification
testing time is minimized, the resulting test sets are supplemented with
some simple, possibly non-specification, tests to achieve 100% fault
coverage. Examples indicate that fault-driven test set development can
lead to drastic reductions in production testing time

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  • Linda Milor

  • Alberto L. Sangiovanni-Vincentelli

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