Minimizing Production Test Time to Detect Faults in Analog Circuits

  • Milor L
  • Sangiovanni-Vincentelli A
  • 7

    Readers

    Mendeley users who have this article in their library.
  • 101

    Citations

    Citations of this article.

Abstract

Analog testing is a difficult task without a clearcut methodology.
Analog circuits are tested for satisfying their specifications, not for
faults. Given the high cost of testing analog specifications, it is
proposed that tests for analog circuits should be designed to detect
faults. Therefore analog fault modeling is discussed. Based on an
analysis of the types of tests needed for different types of faults,
algorithms for fault-driven test set selection are presented. A major
reduction in testing time should come from reducing the number of
specification tests that need to be performed. Hence algorithms are
presented for minimizing specification testing time. After specification
testing time is minimized, the resulting test sets are supplemented with
some simple, possibly non-specification, tests to achieve 100% fault
coverage. Examples indicate that fault-driven test set development can
lead to drastic reductions in production testing time

Get free article suggestions today

Mendeley saves you time finding and organizing research

Sign up here
Already have an account ?Sign in

Find this document

Authors

  • Linda Milor

  • Alberto L. Sangiovanni-Vincentelli

Cite this document

Choose a citation style from the tabs below

Save time finding and organizing research with Mendeley

Sign up for free