Modelling of diffraction from fibre texture gradients in thin polycrystalline films

  • Birkholz M
  • 22


    Mendeley users who have this article in their library.
  • 6


    Citations of this article.


Crystallographic textures in thin polycrystalline films typically exhibit a rotational symmetry, i.e. they occur as a fibre texture with the texture pole being orientated in the direction of the substrate normal. As a further characteristic of thin-film textures, it was often observed that the degree of preferred orientation increases with increasing thickness. It is shown in this work how a fibre texture gradient may be modelled in kinematical X-ray diffraction and which effects it has on the intensity mapping of the IHKL reflection, when the HKL pole is the fibre axis. A general expression for IHKL is derived for a depth-dependent fibre texture that is based on the finite Laplace transform of the texture distribution. The concept is outlined for the cosn[psi] function to model the tilt-angle dependence of intensity, with the parameter n denoting the degree of texture. It is found that the measured intensity distribution sensitively depends on the ratio of texture gradient over X-ray attenuation coefficient. For particular cases, it is found that the maximum intensity may occur for non-zero tilt angles and thus arise at a different tilt angle from the pole of the fibre texture.

Author-supplied keywords

  • Fibre texture
  • Surface acoustic wave devices
  • Texture gradient
  • Thin films

Get free article suggestions today

Mendeley saves you time finding and organizing research

Sign up here
Already have an account ?Sign in

Find this document

Cite this document

Choose a citation style from the tabs below

Save time finding and organizing research with Mendeley

Sign up for free