Perovskites and thin films—crystallography and chemistry

Abstract

We discuss the crystallographic and chemical basis of the perovskite family (ABX 3 ) of oxides that are used in different thin film applications. Starting with the original structure we extend our scope to several modifications. Basic parameters like the ionic radii, the tolerance factor, the occupation of the oxygen sublattice and their effect on the structural parameters will be mentioned together with examples of relationships between structural and physical properties in the bulk and at interfaces.