Pulsed device measurements and applications

  • Scott J
  • Rathmell J
  • Parker A
 et al. 
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Abstract

A pulsed measurement system can provide more than just isothermal characteristic data. An off-the-shelf system can determine rapidly the timing necessary for both pulsed-I-V and pulsed-S-parameter measurements to be isothermal and isodynamic. Instantaneous channel temperature may be determined. Thermal and charge-trapping effects can be separated and time constants measured. Full gain-derivative surfaces can be obtained far more efficiently than by spectral sweep measurements. Characteristics and transient effects following excursions beyond the safe-operating-area and into breakdown may be observed nondestructively

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Authors

  • Jonathan Scott

  • James Grantley Rathmell

  • Anthony Parker

  • Mohamed Sayed

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