Skip to main content
Conference Proceedings

Sensitive volume and triggering criteria of SEB in classic planar VDMOS

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS (2009) 552-558
DOI: 10.1109/RADECS.2009.5994713
3Citations
Citations of this article
8Readers
Mendeley users who have this article in their library.
Get full text

Abstract

This paper presents 2D numerical simulation results allowing to define the sensitive volume and triggering criteria of SEB for VDMOS of classic planar-type technology. The results analysis permits besides to better understand the SEB mechanism. © 2009 IEEE.

Author supplied keywords

Cite

CITATION STYLE

APA

Luu, A., Austin, P., Miller, F., Buard, N., Carriére, T., Poirot, P., … Sarrabayrouse, G. (2009). Sensitive volume and triggering criteria of SEB in classic planar VDMOS. In Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS (pp. 552–558). https://doi.org/10.1109/RADECS.2009.5994713

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Save time finding and organizing research with Mendeley

Sign up for free