A simple method for producing flattened atomic force microscopy tips.

  • Biagioni P
  • Farahani J
  • Mühlschlegel P
 et al. 
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Abstract

We describe a simple and reliable procedure for obtaining a flat plateau on top of standard silicon nitride atomic force microscopy tips by scanning them over the focus of a high-numerical-aperture objective illuminated by near-infrared ultrashort laser pulses. Flattened tips produced this way exhibit a plateau that is parallel to the substrate when the cantilever is mounted. They represent a valid and cost-effective alternative to commercially available plateau tips.

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Authors

  • P Biagioni

  • J N Farahani

  • P Mühlschlegel

  • H-J Eisler

  • D W Pohl

  • B Hecht

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