SRAM cell design for stability methodology

  • Wann C
  • Wong R
  • Frank D
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Author-supplied keywords

  • Circuit simulation
  • Circuit testing
  • Design methodology
  • Guidelines
  • Predictive models
  • Random access memory
  • SRAM cell design
  • SRAM chips
  • SRAM stability
  • Time domain analysis
  • Vectors
  • access disturb margin
  • access disturb mechanism
  • array test
  • circuit stability
  • critical current
  • critical currents
  • direct cell probing
  • integrated circuit design
  • stability methodology
  • statistical analysis

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  • C Wann

  • Robert Wong

  • D J Frank

  • R Mann

  • Shang-Bin Ko

  • P Croce

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