Skip to content
Journal article

Trichloroethylene degradation by photocatalysis in annular flow and annulus fluidized bed photoreactors

Lim T, Kim S ...see all

Chemosphere, vol. 54, issue 3 (2004) pp. 305-312

  • 34


    Mendeley users who have this article in their library.
  • 65


    Citations of this article.
  • 1.9k


    ScienceDirect users who have downloaded this article.
Sign in to save reference


The effects of trichloroethylene (TCE) gas flow rate, relative humidity, TiO2 film thickness, and UV light intensity on photodegradation of TCE have been determined in an annular flow type photoreactor. Phosgene and dichloroacetyl chloride formation could be controlled as a function of TCE gas flow rate and photodegradation of TCE decreased with increasing relative humidity. The optimum thickness of TiO2 film was found to be approximately 5 ??m and the photocatalytic reaction rate of TCE increased with square root of UV light intensity. In addition, the effects of the initial TCE concentration, phase holdup ratio of gas and solid phases (?? g/??s), CuO loading on the photodegradation of TCE have been determined in an annulus fluidized bed photoreactor. The TCE photodegradation decreased with increasing the initial TCE concentration. The optimum conditions of the phase holdup ratio (??g/?? s) and CuO wt.% for the maximum photodegradation of TCE was found to be 2.1 and 1.1 wt.%, respectively. Therefore, an annulus fluidized bed photoreactor is an effective tool for TCE degradation over TiO 2/silica gel with efficient utilization of photon energy. ?? 2003 Elsevier Ltd. All rights reserved.

Author-supplied keywords

  • Annular flow photoreactor
  • Annulus fluidized bed
  • CuO loading
  • Phase holdup ratio
  • Relative humidity
  • TCE gas flow rate
  • TiO2 film thickness
  • UV light intensity

Get free article suggestions today

Mendeley saves you time finding and organizing research

Sign up here
Already have an account ?Sign in

Find this document

Get full text


  • Tak Hyoung Lim

  • Sang Done Kim

Cite this document

Choose a citation style from the tabs below