Wavelength dependence of double ionization of xenon in a strong laser field

Abstract

The wavelength dependence of double ionization of xenon in a 100-fs laser pulse (2-4× 1013 W cm2) has been studied using photoelectron imaging and ion time-of-flight spectrometry. In the wavelength ranges between 1150 and 1560 nm and 792 and 803 nm a pronounced variation of the ratio of ion yields Xe2+ Xe+ is observed. We attribute this variation to the strong influence of a 5 s2 5 p5 →5s5 p6 transition on the dynamics of double ionization. © 2006 The American Physical Society.