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XRD2DScan: new software for polycrystalline materials characterization using two-dimensional X-ray diffraction

  • Navarro A
Journal of Applied Crystallography (2006) 39(6) 905-909
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Navarro, A. (2006). XRD2DScan: new software for polycrystalline materials characterization using two-dimensional X-ray diffraction. Journal of Applied Crystallography, 39(6), 905–909.

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