XRD2DScan: new software for polycrystalline materials characterization using two-dimensional X-ray diffraction

  • Rodriguez-Navarro A
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Abstract

XRD2DScan is a Windows application for displaying and analyzing two-dimensional X-ray diffraction patterns collected with an area detector. This software allows users to take full advantage of diffractometers that are equipped with an area detector but that cannot readily process the information contained in diffraction patterns from polycrystalline materials. XRD2DScan has many capabilities for generating different types of scans (2 theta scan, Psi scan, d spacing versus Psi angle), which allows users to extract the maximum amount of information from two-dimensional patterns. Analyses of multiple data files can be fully automated using batch processing. The use of the software is illustrated through several examples.

Author-supplied keywords

  • DETECTOR
  • TEXTURE

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Authors

  • A B Rodriguez-Navarro

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