Electrical of (BST) thin films was investigated by annealing Pt/BST/Pt structures in and -containing furnace ambients. Deuterium depth profiles were correlated to the current–voltage characteristics of the BST thin films. The dependence of the D distribution
CITATION STYLE
Ahn, J. H., McIntyre, P. C., Mirkarimi, L. W., & Gilbert, S. E. (2000). Deuterium-induced degradation of (Ba, Sr) TiO films. Applied Physics …. Retrieved from http://link.aip.org/link/?APPLAB/77/1378/1
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