Electromechanical response of solids underpins image formation mechanism of several scanning probe microscopy techniques including the piezoresponse force microscopy (PFM) and electrochemical strain microscopy (ESM). While the theory of linear piezoelectric and ionic responses are well developed, the contributions of quadratic effects including electrostriction and capacitive tip-surface forces to measured signal remain poorly understood. Here, we analyze the electrostrictive and capacitive contributions to the PFM and ESM signals and discuss the implications of the dielectric tip-surface gap on these interactions. © 2014 AIP Publishing LLC.
CITATION STYLE
Eliseev, E. A., Morozovska, A. N., Ievlev, A. V., Balke, N., Maksymovych, P., Tselev, A., & Kalinin, S. V. (2014). Electrostrictive and electrostatic responses in contact mode voltage modulated scanning probe microscopies. Applied Physics Letters, 104(23). https://doi.org/10.1063/1.4882861
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