Epitaxial growth in heterogeneous nucleation of pure aluminum

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Abstract

An epitaxial layer for heterogeneous nucleation was obtained through a controlled nucleation process, where liquid Al was nucleated by a selected single crystal α-Al2O3 substrate with large lattice misfit. Transmission electron microscopy analysis suggests an epitaxial layer at the new crystal/substrate interface. According to the results of energy-dispersive X-ray spectroscopy and selected area diffraction patterns, the epitaxial layer is composed of aluminum micro-twins. © 2014 Elsevier B.V.

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Yang, L., Xia, M., & Li, J. G. (2014). Epitaxial growth in heterogeneous nucleation of pure aluminum. Materials Letters, 132, 52–54. https://doi.org/10.1016/j.matlet.2014.06.051

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