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Noncontact Atomic Force Microscopy

by S. Morita, F. J. Giessibl, R. Wiesendanger
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Abstract

Since the original publication of Noncontact Atomic Force Microscopy\nin 2002, the noncontact atomic force microscope (NC-AFM) has achieved\nremarkable progress. This second treatment deals with the following\noutstanding recent results obtained with atomic resolution since\nthen: force spectroscopy and mapping with atomic resolution; tuning\nfork; atomic manipulation; magnetic exchange force microscopy; atomic\nand molecular imaging in liquids; and other new technologies. These\nresults and technologies are now helping evolve NC-AFM toward practical\ntools for characterization and manipulation of individual atoms/molecules\nand nanostructures with atomic/subatomic resolution. Therefore, the\nbook exemplifies how NC-AFM has become a crucial tool for the expanding\nfields of nanoscience and nanotechnology.

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Readership Statistics

13 Readers on Mendeley
by Discipline
 
85% Physics and Astronomy
 
8% Philosophy
 
8% Agricultural and Biological Sciences
by Academic Status
 
38% Student > Ph. D. Student
 
23% Student > Master
 
15% Student > Bachelor
by Country
 
8% Germany
 
8% Finland

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