Optical and Structural Properties of ZnO Nanorods Grown on Polyimide Films
- ISSN: 1882-0778
- DOI: 10.1143/APEX.1.081202
Structural degradation of nanocrystalline ZnO films was observed with an increase in films thickness. Nanocrystalline epitaxial thin film with thickness of ~170 nm changed to polycrystalline ~900 nm with an increase in deposition time. Surface morphology revealed an average grain size of 30-50 nm. Spatial correlation model indicated structural disorder due to relative disorientation of crystalline phases at nanoscale. The photoluminescence spectra showed free exciton (FX) ~3.31 eV, donor bound-exciton (D oX) ~3.26 and donor-acceptor-pair (DAP) ~3.22 eV for thin films, which redshift, i.e., FX ~3.30, D oX ~3.24 eV, and DAP ~3.19-3.17 eV for thicker films (400-900 nm).