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Theory of noncontact dissipation force microscopy

by Michel Gauthier, Masaru Tsukada
Physical Review B ()
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Abstract

The interaction between the tip of the noncontact atomic force microscope\n(nc-AFM) and a surface is analyzed using the Langevin equation approach.\nThe existence of an intrinsically local energy dissipation mechanism\nis demonstrated. This mechanism fundamentally differs from that related\nto adhesion hysteresis between the tip and the surface. A scheme\nreferred to as noncontact dissipation force microscopy is proposed\nfor producing surface images in ultrahigh vacuum. Moreover, a prospect\nfor scanning probe microscopy is raised, namely, the possibility\nof measuring nanomechanical surface properties. It is also shown\nhow nc-AFM operated at large amplitude could be used in principle\nto measure profiles of both the tip-surface interaction force and\nits gradient.

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