Theory of noncontact dissipation force microscopy

by Michel Gauthier, Masaru Tsukada
Physical Review B ()
Get full text at journal


The interaction between the tip of the noncontact atomic force microscope (nc-AFM) and a surface is analyzed using the Langevin equation approach. The existence of an intrinsically local energy dissipation mechanism is demonstrated. This mechanism fundamentally differs from that related to adhesion hysteresis between the tip and the surface. A scheme referred to as noncontact dissipation force microscopy is proposed for producing surface images in ultrahigh vacuum. Moreover, a prospect for scanning probe microscopy is raised, namely, the possibility of measuring nanomechanical surface properties. It is also shown how nc-AFM operated at large amplitude could be used in principle to measure profiles of both the tip-surface interaction force and its gradient.

Cite this document (BETA)

Readership Statistics

28 Readers on Mendeley
by Discipline
57% Physics
18% Materials Science
7% Electrical and Electronic Engineering
by Academic Status
54% Ph.D. Student
11% Researcher (at an Academic Institution)
7% Student (Bachelor)
by Country
7% Canada
4% Germany
4% Japan

Sign up today - FREE

Mendeley saves you time finding and organizing research. Learn more

  • All your research in one place
  • Add and import papers easily
  • Access it anywhere, anytime

Start using Mendeley in seconds!

Sign up & Download

Already have an account? Sign in