Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback

M. Dede; K. Urkmen; A. Oral; I. Farrer; D. A. Ritchie

Conference Proceedings

Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback

Dede M
Urkmen K
Oral A
et al.

INTERMAG 2006 - IEEE International Magnetics Conference (2006) 584

DOI: 10.1109/INTMAG.2006.376308

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Dede, M., Urkmen, K., Oral, A., Farrer, I., & Ritchie, D. A. (2006). Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback. In INTERMAG 2006 - IEEE International Magnetics Conference (p. 584). https://doi.org/10.1109/INTMAG.2006.376308

Variable temperature Scanning Hall Probe Microscopy (SHPM) using quartz crystal AFM feedback

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