Nonlinear metric learning with deep independent subspace analysis network for face verification

1Citations
Citations of this article
9Readers
Mendeley users who have this article in their library.

Abstract

Face verification is the task of determining whether two given face images represent the same person or not. It is a very challenging task, as the face images, captured in the uncontrolled environments, may have large variations in illumination, expression, pose, background, etc. The crucial problem is how to compute the similarity of two face images. Metric learning has provided a viable solution to this problem. Until now, many metric learning algorithms have been proposed, but they are usually limited to learning a linear transformation. In this paper, we propose a nonlinear metric learning method, which leams an explicit mapping from the original space to an optimal subspace using deep Independent Subspace Analysis (ISA) network. Compared to the linear or kernel based metric learning methods, the proposed deep ISA network is a deep and local learning architecture, and therefore exhibits more powerful ability to learn the nature of highly variable dataset. We evaluate our method on the Labeled Faces in the Wild dataset, and results show superior performance over some state-of-the-art methods.© 2013 The Institute of Electronics, Information and Communication Engineers.

References Powered by Scopus

Reducing the dimensionality of data with neural networks

17421Citations
N/AReaders
Get full text

Nonlinear dimensionality reduction by locally linear embedding

13237Citations
N/AReaders
Get full text

A global geometric framework for nonlinear dimensionality reduction

11611Citations
N/AReaders
Get full text

Cited by Powered by Scopus

Metrics Space and Norm: Taxonomy to Distance Metrics

2Citations
N/AReaders
Get full text

Register to see more suggestions

Mendeley helps you to discover research relevant for your work.

Already have an account?

Cite

CITATION STYLE

APA

Cai, X., Wang, C., Xiao, B., & Shao, Y. (2013). Nonlinear metric learning with deep independent subspace analysis network for face verification. In IEICE Transactions on Information and Systems (Vol. E96-D, pp. 2830–2838). Institute of Electronics, Information and Communication, Engineers, IEICE. https://doi.org/10.1587/transinf.E96.D.2830

Readers over time

‘14‘19‘20‘21‘22‘23‘2400.751.52.253

Readers' Seniority

Tooltip

Lecturer / Post doc 2

50%

PhD / Post grad / Masters / Doc 2

50%

Readers' Discipline

Tooltip

Computer Science 2

67%

Engineering 1

33%

Save time finding and organizing research with Mendeley

Sign up for free
0