CITATION STYLE
Zhang, L., Verbeeck, J., Erni, R., & Van Tendeloo, G. (2008). Retrieving dielectric function by VEELS. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 457–458). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_229
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