Analysis of crystallographic orientation on textured Ca-doped (ZnO) min2O3 ceramics by electron back scattering diffraction pattern

Abstract

Crystallographic orientation and phase identification on textured Ca-doped (ZnO)mIn2O3 (m = 3 and 4, denoted as Z mIO) ceramics were investigated for better understanding and further improvement of the high-efficiency n-type thermoelectric oxide materials. Textured ceramics were prepared by the reactive-tern plated grain growth (RTGG) method, in which plate-like reactive seeds were exploited. A combination of electron backscatter diffraction pattern (EBSP) and energy dispersive X-ray spectrometry (EDS) techniques was utilized for analyzing the textured specimen parallel and perpendicular to the original sheet plane in detail. We revealed that in the specimen plate-like grains were aligned parallel to the sheet plane with the thickness direction parallel to the c-axis of each grain. Parallel aligned trigonal Z3IO domains with a 60° misorientation angle were observed in a single grain. Coexisting trigonal Z3IO and hexagonal Z4IO phases were also observed in a single grain. These axis-sharing crystallites must be formed by the in situ topotactic conversion from a common hexagonal template crystal.