CITATION STYLE
Weckx, P., Kaczer, B., Simicic, M., Parvais, B., & Linten, D. (2020). Defect-based compact modeling of random telegraph noise. In Noise in Nanoscale Semiconductor Devices (pp. 517–532). Springer International Publishing. https://doi.org/10.1007/978-3-030-37500-3_16
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