Imaging and characterization of magnetic micro- and nanostructures using force microscopy

Abstract

This chapter introduces into the principles of different force microscopic approaches that sense a magnetic probe-sample force to study magnetism of micro- and (sub)nanometer-sized objects. Although all of them are capable to characterize magnetic properties on small length scales, their applicability depends strongly on the object (e.g., nm-thin magnetic films, magnetic nanoparticles, electronic and nuclear spins) to be investigated. A comparison of their application range will be given, which allows identifying the method most suitable for the intended measurement. Finally, the discussion of each approach is complemented by an overview about current exemplary applications.