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Barriers to AEM: Contamination and Etching

  • Hren J
Springer US, (1979), 481-505
DOI: 10.1007/978-1-4757-5581-7_18
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Hren, J. J. (1979). Barriers to AEM: Contamination and Etching. In Introduction to Analytical Electron Microscopy (pp. 481–505). Springer US. https://doi.org/10.1007/978-1-4757-5581-7_18

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