Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids

Tillmann, K., Barthel, J., Houben, L., Jia, C. L., Lentzen, M., Thust, A., & Urban, K. (2008). Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy of Crystalline Solids. In Microscopy of Semiconducting Materials 2007 (pp. 133–148). Springer Netherlands. https://doi.org/10.1007/978-1-4020-8615-1_30