Magnetostriction measurements on thin films by a slot-line ferromagnetic resonance technique (abstract)

Abstract

We report on a new technique for the determination of the linear magnetostriction constant of thin films. The technique uses the shift in ferromagnetic resonance (FMR) of a magnetostrictive sample upon application of an external stress. A circular thin film is deposited onto a fused quartz plate by ion beam sputter deposition. The plate is mounted in a cantilever configuration, with the film suspended over the junction of a slot-line/coplanar guided structure. The slot line provides a rf magnetic field normal to the film plane, tunable over the frequency range 0.1 GHz