Raman spectroscopy was applied to different-impurities-doped 6H-SiC crystals. It had been found that the first-order Raman spectra of N-, Al- and B-doped 6H-SiC were shifted to higher frequency when comparing with undoped samples. However, the first-order Raman spectra of V-doped sample was shifted to lower frequency, revealing that there existed low free carrier concentration, which might be induced by the deep energy level effect of V impurity. Meanwhile, the second-order Raman spectra are independent of polytype and impurity type. © 2012.
CITATION STYLE
Lin, S., Chen, Z., Li, L., & Yang, C. (2012). Effect of impurities on the raman scattering of 6H-SiC crystals. Materials Research, 15(6), 833–836. https://doi.org/10.1590/S1516-14392012005000108
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