This report focuses on current possibilities and perspectives of scanning X-ray nanodiffraction for probing nanoscale heterogeneities in silk fibers such as nanofibrils, skin-core morphologies, nanocrystalline inclusions and fine fibers down to submicron diameters.
CITATION STYLE
Riekel, C., Burghammer, M., & Rosenthal, M. (2019). Nanoscale X-Ray Diffraction of Silk Fibers. Frontiers in Materials, 6. https://doi.org/10.3389/fmats.2019.00315
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