Structural fault modelling in nano devices

Abstract

In this paper we present a model for structural failures in nano-devices. Fault being considered include stuck-at and bridge faults only. This model is an extension of probabilistic model based on Gibbs energy distribution and belief propagation as presented in NANOLAB [1]. Results have been carried out on a 8-bit full adder circuit. Simulation results indicate that probabilistic TMR model represents bridge and stuck-at-1 faults better while deterministic model is more suited for stuck-at-0 faults. © ICST Institute for Computer Sciences, Social Informatics and Telecommunications Engineering 2009.