Soft X-ray resonant magnetic scattering from a Ni layer with modulated magnetic anisotropy

Abstract

Soft X-ray resonant magnetic scattering studies on a magnetically modulated, but nominally chemically homogenous, 5 nm Ni layer in a Cu/Ni/Cu/Co/NiO/GaAs(110) system are reported. It was possible to estimate the main chemical structure of the sample on the basis of the results from specular reflectivity and rocking scans, probing the scattering vector components in the perpendicular and in-plane direction to the Ni wires, respectively. The magnetic scattering using polarized X-rays demonstrates the magnetic modulation of the Ni layer.