CITATION STYLE
Oikawa, T., Alloyeau, D., Ricolleau, C., Langlois, C., Le Bouar, Y., & Loiseau, A. (2008). 3-dimensional nanoparticle analysis using electron tomography. In EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany (pp. 329–330). Springer Berlin Heidelberg. https://doi.org/10.1007/978-3-540-85156-1_165
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